What are probe stations?
Cascade Microtech FormFactor company made by the world leader in the design and development of wafer and measurement test solutions, allow electrical measurements to be taken to test semiconductor chips and integrated circuits from DC to THz.
Whether you need an affordable manual probe station for taking measurements on samples of up to 150 mm, or semiautomatic solutions for monitoring the temperature and/or pressure of wafers of up to 300 mm, Cascade Microtech offers high performance solutions for on-wafer, circuit board, riser card, MEMS and optoelectronic device measurements, providing highly reliable data.
In addition to the probe station, Ayscom provides accessories such as thermal control systems, measuring probes, micromanipulators, special cables, WinCal XE calibration software.
150-MM PROBE STATIONS
MPS150 manual modular system
Preconfigured EPS150 packages
200-MM PROBE STATIONS
PM8 Manual probe station
Summit Semi Automatic probe system
PA200 semiautomatic probe Station
BlueRay probe system for production
300 mm PROBE STATIONS
CM300 scalable automatic probe system
ELITE300 Probe Station
PM300 Manual probe station
PA300 Probes System
MEASUREMENTS PROBES
Cascade Microtech has more than 50 analytical measuring probes for on-wafer, circuit or package measurements, covering ranges from DC to THz. They can also provide custom adaptations of their solutions.
RF
ACP (Air Coplanar)
T-WAVE
Z PROBE
INFINITY
RF
ACP (Air Coplanar)
T-WAVE
Multi DC-RF
Fotónica
DEDICATED MEASUREMENT SYSTEM
Complete solutions based on Cascade Microtech probe station for various applications such as:
Power device characterisation systems
Vacuum test systems
Cryogenic probe systems
Pressure test systems
Double-sided measuring systems
Production Test systems
Probe station for circuits
SPECIAL DESIGNS
RELIABILITY SYSTEMS Solutions that enable growth depending on the need, from small WLR (wafer-level reliability) applications to large, fully-automated WLR or PLR (package-level reliability) applications.
1164 Reliability test system
Symphony on-wafer reliability test-sistem
Application modules for reliability testing
